Deposition Controller

CRTM-R1 Series

CRTM-R1 CRTM-R1-EL

CRTM-R1
ULVAC has developed new quartz crystal deposition controllers based on our long-time experience and technologies.
Contributes to improved quality and reliability in vapor deposition processes.

CRTM-R1-EL
CRTM-R1-EL is a crystal deposition monitor optimized for the organic EL deposition process.
New measurement method provides excellent resolution and rate stability.





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Features

Excellent rate stability and resolution make it suitable for low-rate control.

Ability value (CI value) measurement function improves crystal anomaly detection.

Simultaneous vapor deposition control of up to 8 sources is possible. (add option)

Communication method supports Ethernet and RS-232C.

Various log data can be saved. Data can be transferred to USB and analyzed on a PC.

   

Applications

CRTM-R1

Thickness and rate control for vapor deposition of metal thin film or optical thin film

CRTM-R1-EL

Film thickness and rate monitoring in OLED deposition process.

     



Contact us for more product information and specifications.

  




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